Skip to main content

Column-Parallel ADC Archietctures Comparison

Japanese IEICE Transactions on Electronics publishes Shoji Kawahito paper "Column-Parallel ADCs for CMOS Image Sensors and Their FoM-Based Evaluations."

"The defined FoM are applied to surveyed data on CISs reported and the following conclusions are obtained:
- The performance of CISs should be evaluated with different metrics to high pixel-rate regions (∼> 1000MHz) from those to low or middle pixel-rate regions.
- The conventional FoM (commonly-used FoM) calculated by (noise) x (power) /(pixel-rate) is useful for observing entirely the trend of performance frontline of CISs.
- The FoM calculated by (noise)2 x (power) /(pixel-rate) which considers a model on thermal noise and digital system noise well explain the frontline technologies separately in low/middle and high pixel-rate regions.
- The FoM calculated by (noise) x (power)/ (intrascene dynamic range)/ (pixel-rate) well explains the effectiveness of the recently-reported techniques for extending dynamic range.
- The FoM calculated by (noise) x (power)/ (gray-scale range)/ (pixel-rate) is useful for evaluating the value of having high gray-scale resolution, and cyclic-based and deltasigma ADCs are on the frontline for high and low pixel-rate regions, respectively.
"

Comments

Popular posts from this blog

Zoom - Home Edition 1.3.0.0 | Perpustakaan Slide - semua slide Anda dalam satu tempat untuk memilih, menciptakan, cetak, email

Zoom - Perpustakaan Slide adalah kecil, sederhana, mudah untuk menggunakan alat organisasi yang dirancang khusus untuk presentasi PowerPoint. Zoom memberikan gambaran lengkap dari seluruh perpustakaan slide PPT.  Anda dapat memilih, cetak, email, atau pdf slide yang ada dan presentasi. Anda dapat bekerja di beberapa slide presentasi dengan PowerPoint tanpa menyentuh sama sekali. Anda dapat

Review of Ion Implantation Technology for Image Sensors

MDPI Sensor publishes " A Review of Ion Implantation Technology for Image Sensors " by Nobukazu Teranishi, Genshu Fuse, and Michiro Sugitani from Shizuoka and Hyogo Universities and Sumitomo. " Image sensors are so sensitive to metal contamination that they can detect even one metal atom per pixel. To reduce the metal contamination, the plasma shower using RF (radio frequency) plasma generation is a representative example. The electrostatic angular energy filter after the mass analyzing magnet is a highly effective method to remove energetic metal contamination. The protection layer on the silicon is needed to protect the silicon wafer against the physisorbed metals. The thickness of the protection layer should be determined by considering the knock-on depth. The damage by ion implantation also causes blemishes. It becomes larger in the following conditions if the other conditions are the same; a. higher energy; b. larger dose; c. smaller beam size (higher beam current d...

Film-Based Light Sensing Review

University of Toronto repo publishes a Nature paper from January 2017 "Solution-processed semiconductors for next-generation photodetectors" by F. Pelayo GarcĂ­a de Arquer, Ardalan Armin, Paul Meredith, and Edward H. Sargent. " Efficient light detection is central to modern science and technology. Current photodetectors mainly use photodiodes based on crystalline inorganic elemental semiconductors, such as silicon, or compounds such as III–V semiconductors. Photodetectors made of solution-processed semiconductors — which include organic materials, metal-halide perovskites and quantum dots — have recently emerged as candidates for next-generation light sensing. They combine ease of processing, tailorable optoelectronic properties, facile integration with complementary metal–oxide–semiconductors, compatibility with flexible substrates and good performance. Here, we review the recent advances and the open challenges in the field of solution-processed photodetectors, examin...